Ultra high speed response with μs-level loading capability
With a current loading speed of up to 60A/μs for a single unit and a slope of over 100A/μs for multiple units in parallel, N67000 meets the needs of testing scenarios such as sensors, AI chips, and high-speed switching power supplies.In power supply testing, when the power supply needs to quickly adjust its output to meet load changes, the rapid response capability ensures the accuracy of test results. In testing systems, N67000 series can more accurately simulate load changes under actual working conditions, thereby providing a more realistic testing environment.
Parallel connection for power extension
N67000 supports parallel connection by master+slave and active currentsharing. When the load power needs to be increased, models with the same voltage specification can be connected in parallel (master + slave) to achieve the required current and power. When using N67000, users only needs to set current on the master. The slave current will be distributed automatically, which simplifies the operation steps.
Multiple operating modes for multiple test scenarios
N67000 supports four normal working modes: CC, CV, CP, and CR. In order to cope with the change of load characteristics in the actual test process, N67000 has also been developed with CV+CC, CR+CC, CV+CR, CP+CC four combined working modes. For example, CR+CC is suitable for the startup test of power supply to prevent overcurrent protection when the power supply is turned on. CV+CR can replace the setting application of Von point. CV+CC can simulate the working mode transition process of battery charging. Users can choose different working modes for test according to their actual situation.
High speed dynamic mode, with dynamic frequency sweep
N67000 has a high-speed dynamic mode. The dynamic characteristics of the DC power supply can be tested by simulating the dynamic load behavior of the power supply through the dynamic mode. N67000 provides dynamic frequency sweep and programmable dynamic mode, including CCD constant current dynamic, CVD constant voltage dynamic, CRD constant resistance dynamic, and CPD constant power dynamic. Programmable dynamic load mode allows setting of high/low range, rise/fall slew rate etc.
Charge/discharge test
Users can set different conditions on the front panel to meet their test demands. For example, when battery voltage is lower than initial voltage, N67000 internal counter will start counting. The counter will stop working until the battery voltage drops to cut-off voltage.
OCP (over current protection) test
During OCP test, N67000 will load under CC mode and check whether the DUT voltage is lower than cut-off voltage. If lower, N67000 will record the present loading current as the test result and shut the input to stop the test. If the DUT voltage is higher than cut-off voltage, N67000 will increase the loading current until the DUT voltage is lower than cut-off voltage or it reaches the Max. loading current.
